X-ray Analytical Microscope Super Large Chamber Model (Micro-XRF) XGT-9000SL

X선 분석 현미경 초대형 챔버 모델

큰 샘플에 대한 안전한 X-선 현미경 분석 가능

대용량 챔버 용량(W x D x H) : 1030 mm x 950 mm x 500 mm

맵핑 영역 크기 : 350 x 350 mm2

감도와 공간 분해능을 저하시키지 않는 고감도의 <15 µm 스팟 사이즈

투과상 및 형광 X선 동시 검출

JAIMAS0101-2001/IEC1010-1을 준수하는 X선 차폐로 X선 노출로부터 사용자 보호

He 퍼지 모듈로 C를 비롯한 경원소 검출 가능

How the XGT-9000SL provides the ultimate performance in speed and flexibility

Excitation system XGT-9000SL allows X-ray fluorescence analysis at the microscopic level even on a large sample by using microprobes such as <15 µm and <100 µm ultra-high intensity probes. The X-ray generator can offer high output of X-ray irradiation up to 50 kV and 1000 µA. Thus, the high performance of the excitation system provides ultimate performance and flexibility for your large sample analysis.
Optical images Capturing clear images is critical for micro-XRF. XGT-9000SL provides two types of cameras to grasp the image of the whole sample and its details down to the microscopic level. Multiple illumination modes help to observe brilliant images, even for reflective and transparent samples.
Sample chamber XGT-9000SL’s large chamber capacity (1030 mm x 950 mm x 500 mm) can accommodate a wide variety of samples from micro-size fragments to samples as large as electronic circuit boards and paintings. XGT-9000SL is equipped with X-ray shields complying with JAIMAS0101-2001/IEC1010-1, which protect you from X-ray exposure. XGT-9000SL can allow sample analysis without destructive sample preparation or compromising your safety.
Detectors XGT-9000SL provides both a transmission X-ray detector and a fluorescent X-ray detector. The transmission X-ray detector enables users to detect internal defects and foreign matter of a sample. The fluorescent X-ray detector can detect from Americium down to carbon, with a light elements detector and He-purge module.
Software suite XGT-9000SL software, of course, covers all basic measurements such as single spot analysis, multiple spot analysis, line analysis, and map imaging. Apart from the standard software functions, advanced modules can be added to the software suite to provide more comprehensive user experiences. These include: Multilayer FPM module for thickness measurement with/without standards RoHS module for RoHS screening Queue module for automated multiple measurements in unattended mode Particle Finding module for particle composition/classification analysis and co-localized analysis LabSpec Link module for data transfer to LabSpec 6 for multivariate analysis

Application Examples

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Basic information
Instrument	X-ray fluorescence analytical microscope
Sample type	Solids, Liquids, Particles
Detectable elements	C* – Am with optional light elements detector F* – Am with standard detector *He purge condition is necessary to detect down to carbon and fluorine for both detectors
Available chamber size	1030(W) x 950(D) x 500(H)
Maximum sample size	500(W) x 500(D) x 500(H)
Maximum mass of sample	10 kg
Optical observation	Two high resolution cameras with objective lens
Optical design	Vertical-Coaxial X-ray and Optical observation
Sample illumination/observation	Top, Bottom, Side illuminations/Bright and Dark fields

X-ray tube
Power	50 W
Voltage	Up to 50 kV
Current	Up to 1 mA
Target material	Rh

X-ray optics
Number of probes	Up to 4
Primary X-ray filters for spectrum optimization	5 positions

Detectors
X-ray Fluorescence detector	Silicon Drift Detector (SDD)
Transmission detector	NaI(Tl)

Mapping analysis
Mapping area	350 mm x 350 mm
Step size	4 μm

Operating mode
Sample environment	Partial vacuum / Ambient condition / He purged condition (optional)* *He purge condition is necessary to detect down to carbon and fluorine for both detectors.

Dimensions (unit: mm)

Glass-Filled Ruby Characterization with the XGT-9000, HORIBA’s new micro-XRF

Gemstones for jewelry are treated by heating, irradiation, or filling of cracks to make them flawless. We performed imaging analyses using an XGT-9000 X-ray Analytical Microscope on a ruby provided by Mineralab. The transmission X-ray imaging revealed that the ruby included several internal defects, and the fluorescent X-ray imaging revealed that the ruby surface was treated by filling with Pb, Mg and Si which are representative of lead glass.

Non-destructive thickness and composition analysis of NiP/Au plating on Cu contacts using micro-XRF

We carried out plating thickness and composition analysis on dual-layer NiP/Au plating on Cu contacts on a flexible printed circuit using a HORIBA X-ray analytical microscope. We successfully detected Au of ultra-thin layer without any sample preparation. The thickness results of Au and NiP plating were consistent with the provided values and with good repeatability.

Non-destructive failure analysis of a commercial PEMFC using a micro-XRF with a super large chamber

We introduce non-destructive failure analysis on a large membrane electrode assembly (MEA) from a commercial PEMFC stack using a HORIBA XGT-9000SL, a micro-XRF with an extra-large chamber capacity. Thanks to the chamber capacity, we successfully performed non-destructive elemental imaging on a defective area without cutting the sample, and we found unexpected distributions of Fe, Ni, Mn and Cr within the defective area, and that the elements are present in the MEA as a result of possible degradation of the bipolar plate.

Surface analysis on a brake rotor of automotive tire

The XGT-9000SL’s large chamber capacity allows you to put whole a brake rotor and carry out spectrum analysis and elemental distribution imaging on the rotor surface, non-destructively.

Non-destructive failure analysis on a large printed circuit board

Our XGT-9000SL allows failure analysis at a microscopic level on a large sample, non-destructively, thanks to its large chamber capacity and its microprobes.

Size: 3.92 MB

MicroXRF Analytical Microscope XGT-9000

Size: 1.58 MB

Technical Note - The New HORIBA XGT-9000: An Overview