Particle Detection

Comprehensive Particle Detection for Semiconductor Manufacturing Processes

For Semiconductor manufacturing processes, where the most advanced micro-fabrication techniques are used, quality management is a critical issue that directly impacts business.

It is important to constantly inspect for the presence of particle contamination. By making use of advanced analysis technologies, HORIBA provides cost effective leading-edge particle detection solution to semiconductor manufactures.

Related Products

PD Xpadion
PD Xpadion

Reticle / Mask Particle Detection System

RP-1
RP-1

Reticle/Mask Particle Remover

제품 문의

HORIBA제품의 자세한 정보를 원하시면, 아래의 양식에 내용을 입력을 부탁드립니다.

* 는 필수입력항목입니다.

Corporate