Production processes are evolving rapidly which is reflected in a growing need for high-grade evaluation and analysis of a wide range of thin films and complex multilayer structures. HORIBA systems are capable of measuring film properties including stress, thickness and optical constants of complex and multilayer films and ultra-thin SiO2 films.
HORIBA제품의 자세한 정보를 원하시면, 아래의 양식에 내용을 입력을 부탁드립니다.
