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Material Characterization

          From blank wafer to final device, HORIBA’s analytical instrument for material characterization are used by leading end-user and research organization for more than 50 years. Designed to achieve ultimate performances, they are the right tools to accelerate the time to market and yield improvement in any processes involving thin film and advanced material deposition.

Film Thickness

UVISEL Plus In-Situ
UVISEL Plus In-Situ

In-situ spectroscopic ellipsometer for real-time thin film monitoring

Spectroscopic Ellipsometer - In-Line
Spectroscopic Ellipsometer - In-Line

In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems

Auto SE
Auto SE

Spectroscopic Ellipsometer for Simple Thin Film Measurement

Band Gap

Fluorolog-QM
Fluorolog-QM

Modular Research Fluorometer for Lifetime and Steady State Measurements

Duetta
Duetta

Fluorescence and Absorbance Spectrometer

Stress / Strain

LabRAM HR Evolution
LabRAM HR Evolution

Confocal Raman Microscope

Defect Analysis

Cathodoluminescence - CLUE Series
Cathodoluminescence - CLUE Series

Cathodoluminescence Solutions for Electron Microscopy

iHR320
iHR320

중초점 길이 이미징 분광기

LabRAM HR Evolution
LabRAM HR Evolution

Confocal Raman Microscope

LabRAM Soleil
LabRAM Soleil

Raman Microscope

SMS
SMS

Add Spectroscopy to ANY Microscope

Elemental Composition

GD-Profiler 2™
GD-Profiler 2™

Glow Discharge Optical Emission Spectrometer

ICP-OES
ICP-OES

Complete your ICP-OES Spectrometer for your specific needs

Chemical Identification

XGT-9000
XGT-9000

X선 분석 현미경(Micro-XRF)

XGT-9000SL
XGT-9000SL

X선 분석 현미경 초대형 챔버 모델

Carrier Lifetime

DeltaFlex
DeltaFlex

형광수명측정기

Layers of 2D Materials

XploRA Nano
XploRA Nano

AFM-Raman for Physical and Chemical imaging

LabRAM Odyssey Nano
LabRAM Odyssey Nano

AFM-Raman for physical and chemical imaging

Particle Analysis

ViewSizer 3000
ViewSizer 3000

멀티 레이저 나노 입자 추적 분석기

Partica CENTRIFUGE*
Partica CENTRIFUGE*

원심 나노 입자 분석기

제품 문의

HORIBA제품의 자세한 정보를 원하시면, 아래의 양식에 내용을 입력을 부탁드립니다.

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