From blank wafer to final device, HORIBA’s analytical instrument for material characterization are used by leading end-user and research organization for more than 50 years. Designed to achieve ultimate performances, they are the right tools to accelerate the time to market and yield improvement in any processes involving thin film and advanced material deposition.
In-situ spectroscopic ellipsometer for real-time thin film monitoring
In-Line Spectroscopic Ellipsometer for Web Coater and Roll to Roll Systems
Spectroscopic Ellipsometer for Simple Thin Film Measurement
Modular Research Fluorometer for Lifetime and Steady State Measurements
Fluorescence and Absorbance Spectrometer
Confocal Raman Microscope
Cathodoluminescence Solutions for Electron Microscopy
중초점 길이 이미징 분광기
Confocal Raman Microscope
Raman Microscope
Add Spectroscopy to ANY Microscope
Glow Discharge Optical Emission Spectrometer
Complete your ICP-OES Spectrometer for your specific needs
X선 분석 현미경(Micro-XRF)
X선 분석 현미경 초대형 챔버 모델
형광수명측정기
AFM-Raman for Physical and Chemical imaging
AFM-Raman for physical and chemical imaging
멀티 레이저 나노 입자 추적 분석기
원심 나노 입자 분석기
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