Applications

# 阴极荧光光谱测定定位合成CVD金刚石薄膜中的荧光缺陷

The crystal may seem to be uniform in the SEM image, but the dark spot such as the threading dislocation can be observed when measuring the CL intensity image at the wavelength (362nm) which corresponds to the band edge emission.

R-CLUE

H-CLUE

F-CLUE