• Reference: ELL1
  • Dates:

    • March 26-28, 2018
    • November 19-21, 2018

  • Who should attend: New users of HORIBA ellipsometers
  • Duration: 3 days (From 9 am to 5 pm)
  • Provides a thorough background in the basic ellipsometry theory and focus on modeling techniques with a large variety of hands-on sample analysis.
  • Use of the ellipsometer and DeltaPsi2 software through a large variety of hands-on sample analysis.

Day 1

Theory and Practical Session

  • Ellipsometry theory
  • Instrumentation
  • Overview of modeling process
  • Description of main functions of DeltaPsi2 software & hands on the ellipsometer
  • Procedure to check the system before to perform measurements
  • Measurement and modeling of transparent films on opaque substrates  

Day 2

Practical Session & Software Use

  • Sample analysis of semi–absorbing thin films in monolayers and multilayers of opaque substrate
  • EMA, Roughness
  • Sample analysis of glass substrate
  • Sample analysis of semi-absorbing thin films on  glass
  • Sample analysis of absorbing films
  • Dispersion formulae parameterization
  • Sample analysis of thickness  of non-uniform  layers

Day 3

Practical Session: Customer Samples