LabRAM Soleil Nano for the chemical analysis of thin film solar cell interfaces

Thin film solar cells consist of complex multilayered structures, whose composition and arrangement are crucial for the final performances of photovoltaic devices. One of the aspects susceptible of affecting solar cells efficiency is inter-layer penetration and contamination. In this application note, this cross-contamination phenomenon could be successfully observed and characterized thanks to HORIBA’s LabRAM Soleil Nano, which couples the chemical accuracy of Raman spectroscopy with the nanometric resolution of AFM.

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Application note: LabRAM Soleil Nano for the chemical analysis of thin film solar cell interfaces

Raman spectroscopy coupled with atomic force microscopy (AFM) allows a precise nano-scale characterization of the layers composing thin film solar cells, as well as the cross-contamination occurring at their interfaces.

LabRAM Soleil Nano for the chemical analysis of thin film solar cell interfaces

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