Patrick Chapon

Biography

Patrick Chapon is GD-OES Product Manager and Senior Expert at HORIBA France, specializing in elemental depth profiling and surface analysis. He has contributed to more than 80 scientific publications and 17 patents related to glow discharge technology. Alongside his research and development activities, he shares his expertise through customer training and teaching at Université Paris-Saclay.

Webinars 〉    Application notes 〉    Patents 〉    Papers 〉    Books 〉

Webinars by Author Patrick Chapon

Application Notes by Author Patrick Chapon

Papers by Author Patrick Chapon (extract)

Campbell, S., Qu, Y., Bowen, L., Chapon, P., Barrioz, V., Beattie, N. S., & Zoppi, G. (2018). Influence of OLA and FA ligands on the optical and electronic properties of Cu2ZnSn (S, Se) 4 thin films and solar cells prepared from nanoparticle inks. Solar Energy, 175, 101-109.
Jonnard, P., Modi, M. H., Le Guen, K., Aneshwari, N., Sinha, M., Idir, M., ... & Galtayries, A. (2018). Study of the Au‐Cr bilayer system using X‐ray reflectivity, GDOES, and ToF‐SIMS.Surface and Interface Analysis, 50(11), 1213-1217.
Lee, H., Gaiaschi, S., Chapon, P., Marronnier, A., Lee, H., Vanel, J. C., ... & Geffroy, B. (2017). Direct experimental evidence of halide ionic migration under bias in ch3nh3pbi3–x clx-based perovskite solar cells using gd-oes analysis.ACS Energy Letters, 2(4), 943-949.
Mohajernia, S., Mazare, A., Hwang, I., Gaiaschi, S., Chapon, P., Hildebrand, H., & Schmuki, P. (2018). Depth elemental characterization of 1D self-aligned TiO2 nanotubes using calibrated radio frequency glow discharge optical emission spectroscopy (GDOES).Applied Surface Science, 442, 412-416.
Gaiaschi, S., Richard, S., Chapon, P., & Acher, O. (2017). Real-time depth measurement in glow discharge optical emission spectrometry via differential interferometric profiling.Journal of Analytical Atomic Spectrometry, 32(9), 1798-1804.
Cojocaru, L., Uchida, S., Matsubara, D., Matsumoto, H., Ito, K., Otsu, Y., ... & Segawa, H. (2016). Direct Confirmation of Distribution for Cl− in CH3NH3PbI3− xClx Layer of Perovskite Solar Cells.Chemistry Letters, 45(8), 884-886.
Mercier, D., Bouttemy, M., Vigneron, J., Chapon, P., & Etcheberry, A. (2015). GD-OES and XPS coupling: A new way for the chemical profiling of photovoltaic absorbers.Applied Surface Science, 347, 799-807.
Iyyakkunnel, Santhosh, Laurent Marot, Baran Eren, Roland Steiner, Lucas Moser, Daniel Mathys, Marcel Düggelin, Patrick Chapon, and Ernst Meyer. Morphological changes of tungsten surfaces by low-flux helium plasma treatment and helium incorporation via magnetron sputtering. ACS applied materials & interfaces 6, no. 14 (2014): 11609-11616.
Ber, B., Bábor, P., Brunkov, P. N., Chapon, P., Drozdov, M. N., Duda, R., ... & Tolstogouzov, A. (2013). Sputter depth profiling of Mo/B4C/Si and Mo/Si multilayer nanostructures: A round-robin characterization by different techniques.Thin Solid Films, 540, 96-105.
Warwick, M. E., Hyett, G., Ridley, I., Laffir, F. R., Olivero, C., Chapon, P., & Binions, R. (2013). Synthesis and energy modelling studies of titanium oxy-nitride films as energy efficient glazing.Solar energy materials and solar cells, 118, 149-156.
Lanzutti, A., Marin, E., Lekka, M., Chapon, P., & Fedrizzi, L. (2012). Rf‐GDOES analysis of composite metal/ceramic electroplated coatings with nano‐to microceramic particles' size: issues in plasma sputtering of Ni/micro‐SiC coatings.Surface and interface analysis, 44(1), 48-55.
Malherbe, J., Fernández, B., Martinez, H., Chapon, P., Panjan, P., & Donard, O. F. (2008). In-depth profile analysis of oxide films by radiofrequency glow discharge optical emission spectrometry (rf-GD-OES): possibilities of depth-resolved solid-state speciation.Journal of Analytical Atomic Spectrometry, 23(10), 1378-1387.
Le Coustumer, P., Motelica‐Heino, M., Chapon, P., François Saint‐Cyr, H., & Payling, R. (2003). Surface characterization and depth profile analysis of glasses by rf GDOES.Surface and Interface Analysis: An International Journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films, 35(7), 623-629.
Payling, R., Aeberhard, M., Michler, J., Authier, C., Chapon, P., Nelis, T., & Pitchford, L. (2003). Theory of relative sputtering rates in GDOES.Surface and Interface Analysis: An International Journal devoted to the development and application of techniques for the analysis of surfaces, interfaces and thin films, 35(4), 334-339.
Chapon, P., Payling, R., & Shimizu, K. (2002). Analysis of hard disks with radiofrequency glow discharge optical emission spectrometry.American laboratory (Fairfield), 34(4), 52-53.

Book chapters by Author Patrick Chapon (extract)

P. Le Coustumer, P. Chapon & al, chap. Thin and Thick films in Applied Handbook of Mass Spectrometry, M. Lee ed, Wiley – 2011
J.P. Laude, P. Chapon, Spectrométrie de décharge luminescente (GDOES et GDMS) Techniques de l’ingénieur P 2715V2
R Payling, P. Chapon & al, chap. Surface, thin films and coatings in Glow Discharge Plasmas in Analytical Spectroscopy, R.K. Marcus, J.A.C. Broekaert eds. Wiley, 2003
S Dubent, P. Chapon, Caractérisation des surfaces par SDL. Techniques de l’ingénieur. M 1675 V3.
P. Chapon, S. Gaiaschi, K. Shimizu, chapter on GDOES in Compendium of Surface and Interface Analysis .Springer 2018.
Corporate