Forensic Science: Microscopy in Trace Analysis

HORIBA Scientific is pleased to announce a workshop organized in partnership with this year’s FACSS conference entitled Forensic Science: Microscopy in Trace Analysis. The workshop will be held at 9am on Sunday 2nd October, 2011 at the Grand Sierra Resort in Reno, NV, USA.

This workshop will review the use of FT-IR, Raman, UV-VIS and XRF microspectroscopy in forensic science. These techniques will be described in detail. The ability to both see and identify minute amounts of material through a microscope is enhanced by adding spectroscopy to the microscope combining spectroscopy with optical microscopy.

Speakers at the workshop include John Reffner (John Jay College), Ed Suzuki (Washington State Patrol), Joanne Busaglia (FBI) and Mary Carrabba (Southern Oregon University).

Participants will have the opportunity to hear these experts in the field of forensic science and instrumentation describe and demonstrate how microspectroscopy is put to great effect in trace analysis. Real forensic examples will be provided to illustrate the power of microspectroscopy to provide key evidence to help solve crimes. There will also be a hands on session in which workshop attendees will be able to run samples on FT-IR, Raman and XRF microscopes.

General Information

Click here to download a leaflet about this workshop.

The workshop is free, but advanced registration is required due to the limited number of places available. You may register directly at .

If you have any questions please contact us.

Workshop Venue:

FACSS 2011
38th FACSS
Grand Sierra Resort
Reno, NV