Event
Beginning: 04/14/26
Location: Online
X-ray fluorescence (XRF) delivers fast, non-destructive elemental analysis with little to no sample prep—making it ideal for failure investigation, contaminant identification, and root-cause analysis. In this session, we’ll review XRF fundamentals and show how XRF microscopy accelerates elemental mapping and spot analysis for faster answers.
You’ll see how the XGT-9000 XRF microscope enables rapid, high-contrast elemental mapping and targeted spot analysis—so you can move from suspicion to evidence in minutes. Through real-world case studies, we’ll demonstrate how XRF pinpoints issues such as tungsten-related failures in saw blades, solder composition problems in microchips, conductive metal particles in battery separators, defects in pharmaceutical tablets, and even unexpected lead contamination in biological samples.
If you’re responsible for materials analysis, manufacturing troubleshooting, or laboratory workflows, you’ll leave with clear guidance on when and how to use XRF to get confident answers faster—and how micro-XRF integrates seamlessly into your investigative process.
What You Will Learn:
- XRF Fundamentals: How XRF identifies elements and why it’s non-destructive.
- When XRF Wins: Where XRF (and micro-XRF) outperforms or complements SEM-EDS and wet chemistry.
- Micro-XRF in Action: How the XGT-9000 speeds failure/contaminant detection with rapid mapping + spot analysis.
- Workflow Best Practices: Sample handling, calibration, and interpreting spectra/maps with confidence.
- Real Case Studies: Practical lessons from blades, chips, batteries, tablets, and biological samples.
Who Should Attend:
- Failure analysis & materials engineers
- QA/QC and reliability teams
- Battery, electronics, and semiconductor R&D
- Pharmaceutical and medical device analysts
- Forensic and materials science researchers
- Lab managers seeking faster, non-destructive workflows
