Thickness of Thin Film for Semiconductors

Camera Endpoint Monitor based on Real Time Laser Interferometry

For Flat Panel Display and Photovoltaic Industries

Intuitive Auto-Soft Interface for the Auto SE and Smart SE

A Platform for HORIBA Ellipsometers

Ergonomic software for data acquisition, data treatment and technical support

In-situ spectroscopic ellipsometer for real-time thin film monitoring

A versatile spectroscopic ellipsometer covering a large range from VUV to NIR

X-ray Analytical Microscope