PD Xpadion

光罩顆粒檢測系統

滿足未來需求的新一代檢測平台

PD-Xpadion 是 HORIBA 顆粒檢測產品的最新一代。基於創新的模組化平台設計,PD Xpadion 是滿足生產過程中光罩和薄膜檢查當前和未來需求的最佳工具。將晶圓廠自動化與 HORIBA 核心技術相結合,不僅包括顆粒檢查和檢測,還包括透過拉曼分析進行顆粒表徵、薄膜厚度和均勻性以及薄膜健康監測工具。

事業部: Semiconductor
產品分類: Metrology
製造商: HORIBA, Ltd.

請選擇一個本產品可販售的國家或區域:
China,Germany,Ireland,Israel,Italy,Korea (South),Malaysia,Singapore,Taiwan,United Kingdom,United States
瀏覽完整列表 點擊此處.

  • Adjustable detection sensitivity by utilizing a combination of optical systems
  • OHT, EFEM, multi-port, multi-slot adaptation
  • Ability to reanalyse inspection data for faster inspection recipe optimization
  • Integration options with other HORIBA sensor products like Raman spectroscopy and Ellipsometry
  • False detection reduction function
  • Innovative software with improved usability
Model PD Xpadion
Dimensions(W) x (D) x (H)1,000 x 1,850 x 1,600 mm
WeightApprox. 950kg
Inspection Particle SizePattern0.5 μm / 0.35 μm (0.1 μm : Blank Mask)*¹
Glass5.0 μm (0.5 μm - : High Sensitivity Option)*¹
Pellicle10.0 μm (0.5 μm - : High Sensitivity Option)*¹
Light Source633 nm He-Ne laser or 488 nm Solid-state laser
Reticle Size5 inch - 9 inch
Case openersSMIF POD, Compatible with various cases
ThroughputApprox. 12 min (From inspection start to test result display for 2 surface (6 inch) inspection)
Panel Surface TreatmentStainless Steel
Installation EnvironmentCleanlinessClass6 ISO standards or better 
Temperature23 +/- 1°C
UtilitiesPowerAC200-240 V, 2 kVA 50/60Hz, Single Phase
Vacuum SourcePressure -80 kPA or less
Compressed Air0.6 MPa - 0.7 MPa

New Function / Option

Reticle Edge HandlingYes
Auto Capture / Auto SizingYes
Data Browser FunctionYes
False Detection Reduction FunctionYes

*PSL equivalent , HORIBA recommends customer sample test for inspection sensitivity validation.

留言諮詢

如您有任何疑問,请在此留下詳細需求或問題,我們將竭誠您服務。

* 這些欄位為必填項目。

Related products

ANALYSETTE 28 ImageSizer*
ANALYSETTE 28 ImageSizer*

Dynamic Image Analysis

Eyecon2™*
Eyecon2™*

Direct Imaging Particle Analyzer

nanoPartica SZ-100V2 Series
nanoPartica SZ-100V2 Series

Nanoparticle Analyzer

Partica LA-960V2
Partica LA-960V2

Laser Scattering Particle Size Distribution Analyzer

Partica mini LA-350
Partica mini LA-350

Laser Scattering Particle Size Distribution Analyzer

PSA300*
PSA300*

Static Image Analysis System Particle Size

RP-1
RP-1

Reticle/Mask Particle Remover

SA-9600 Series
SA-9600 Series

BET Flowing Gas Surface Area Analyzers

SA-9650 Series
SA-9650 Series

BET Surface Area Analyzers

ViewSizer 3000
ViewSizer 3000

Simultaneous Multi-Laser Nanoparticle Tracking Analysis (NTA)

nanoPartica SZ-100V2 Series
nanoPartica SZ-100V2 Series

Nanoparticle Analyzer

Partica LA-960V2
Partica LA-960V2

Laser Scattering Particle Size Distribution Analyzer

Partica mini LA-350
Partica mini LA-350

Laser Scattering Particle Size Distribution Analyzer

Corporate