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Particle Analysis

Powders and fine particles are widely used for research and development and quality control in many industrial and academic fields, such as ceramics, functional polymers, food, cosmetics, pharmaceuticals, chemical industry, semiconductors, catalysts, battery materials, and life sciences. Particle measurements such as particle size distribution, nanoparticle size distribution, zeta potential, molecular weight, and image analysis are essential to know the characteristics of various particles. In semiconductor field, the particle size in the CMP slurry is the key factor of the performance for CMP process.

HORIBA's Partica series of laser diffraction/scattering particle size distribution analyzers has always led the world in the field of particle size distribution measurement, driving the research and development of advanced materials and improving their quality.

Partica mini LA-350
详情 Partica mini LA-350

激光粒度分析仪

Partica LA-960V2
详情 Partica LA-960V2

激光粒度分析仪

ViewSizer 3000
详情 ViewSizer 3000

多激光纳米颗粒追踪分析仪 (NTA)

nanoPartica SZ-100V2
详情 nanoPartica SZ-100V2

纳米粒度及Zeta电位分析仪

SmartSPM
详情 SmartSPM

先进原子力显微镜

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