PX-375

具有 X 射線的連續顆粒監測儀

透過自動採樣進行連續元素和顆粒品質分析

人們越來越關注顆粒物 (PM) 污染及其對健康的影響。對於有效的預防措施,源頭PM濃度的測定極為重要。因此,PM 和元素濃度的指示至關重要。 PX-375 分析儀採用自動採樣、連續線上 PM 定量和定性分析來快速測量空氣污染。

產品分類: Ambient
製造商: HORIBA, Ltd.
  • 透過單一裝置直接在現場連續分析 PM 質量和元素濃度。

  • 採用世界公認的技術:X 射線螢光和 Beta 射線衰減。

  • HORIBA 的濾帶提供出色的靈敏度和精確的性能

  • 安裝的 CMOS 攝影機可以觀察過濾器收集的顆粒樣本。使用者友好的顯示和操作

<表1>最低檢測極限(範例)(2σ)(ng/m3)

* LDL (σ) is half of the LDL (2σ)

<表2>可檢測元素

* O - 標準參數,由標準校準材料校準。

* 對於元素濃度的測量,需要使用標準校準材料進行校準。

* 對於標記為不可偵測的元素,請單獨聯絡。 產品的規格、外觀或其他方面如有變更,恕不另行通知。如果您喜歡演示,請聯絡我們考慮購買該產品。

相關產業

 

相關應用
 

相關文章(利用 PX-375 的研究論文列表)

Product nameContinuous Particulate Monitor with X-ray Fluorescence
ModelPX-375
Measured objectParticulate matter (PM10, PM2.5, TSP)
Measurement contentParticulate mass concentration and element concentration

Common

Flow rate16.7L/min
Sampling pumpLinear drive system, externally installed
Filter tapeNone-woven PTFE fabric filter
Spot tape interval20/25/50/100mm selectable
Filter tape replacement intervalApprox. 1 month (In case of 100mm spot interval)
Ambient operation temperature10˚C~30˚C
Relative humidity0~80% RH noncondensing
Altitude1000m or less
Power supplyAC100V~240V ±10%, 50/60Hz±1%
Power consumptionApprox. 400VA
External dimension430mm(W)×550mm(D)×285mm(H) (without sampling pipe and measurement head)
WeightApprox. 40kg (Without sampling pipe and measurement head)
Data outputCSV file (Average PM mass and elemental concentration)
External connectionEthernetTM, USB, RS-232C* (option)

*Please consult about communication and instrument composition separately.

Mass analyzer unit

Measurement methodBeta-ray attenuation
PM10US EPA Louvered PM10 Inlet
PM2.5BGI VSCCTM Cyclone
TSPTSP Inlet
Measurement range0~200/500/1000μg/m3
Repeatability±2% (against reference foil value)
Span drift±3% (24hours)
Lowest detection limit (2σ)±4μg/m3 (24hours)
Sampling and measurement cycle0.5/1/2/3/4/6/8/12/24 hours

Element analyzer unit

Measurement methodEnergy dispersive X-ray spectroscopy
Detectable elementsSee Table 2 "Detectable Elements".
Standard parameter is S, Ti, Cr, Mn, Ni, Cu, Zn, Pb, Al, Si, K, Ca, V, Fe, As.
Primary X-ray filterAutomatic switching for light metals/heavy metals
Tube voltageAutomatic switching for 15kV/50kV
DetectorSDD (Silicon Drift Detector)
Sample imageCMOS camera
Lowest detection limit (2σ)Recommended EPA Method IO 3.3
See Table 1 "Lowest Detection Limit (Example)"
Measurement rangeUp to measurement time
Analysis time1000s (16.6 min) as standard
100 / 200 / 500 / 1000 / 2000 / 5000 / 10000s selectable
Calibration material for X-ray intensity for standard parameterNIST SRM 2783, other materials (option)
Safety functions for X-rayInternal lock system
Key switch
X-ray indication light
Chemical Speciation of Particulate Matter from Steel and Refining Plants
Chemical Speciation of Particulate Matter from Steel and Refining Plants

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如您有任何疑問,请在此留下詳細需求或問題,我們將竭誠您服務。

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