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半導體新聞

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Release of PD Xpadion EX Reticle / Mask Particle Detection System

Smart detection and removal of particle contamination using a single system to achieve the utmost efficiency and yield in semiconductor manufacturing…

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HORIBA STEC to Build New Factory in Fukuchiyama, Kyoto

HORIBA Group’s largest ever investment aims to establish a supply structure with long-term stability

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Release of the MICROPOLE System QL Series Quadrupole Mass Analyzer

Precise Management and Control of Vacuum Chamber Conditions Contributing to More Efficient Semiconductor Production

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