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HORIBA新型微区XRF XGT-9000对玻璃填充红宝石的表征
用于首饰的宝石通过加热、辐射或填充裂纹等工艺来处理，可使其更加完美。我们使用XGT-9000 微区X射线荧光分析仪对Mineralab公司提供的红宝石进行了成像分析。通过透射X射线成像结果，可发现红宝石内部存在部分缺陷，而荧光X射线成像则显示出红宝石表面经过填充处理，其中包括Pb、Mg和Si等代表铅玻璃的物质。
Why Choose Micro-XRF for Elemental Imaging?
X-ray fluorescence spectrometer (XRF) can non-destructively confirm the presence of Pb, but it doesn’t provide elemental distribution information. LA-ICP-MS offers highly sensitive elemental analysis; however, it involves minor surface damage caused by laser ablation. Elemental mapping is possible but requires scanning the sample while progressively removing material from the surface.
In contrast, micro-XRF elemental imaging generates spatial distribution maps of Pb without damaging the gemstone, allowing the extent of lead-glass filling along fractures to be visualized intuitively.
