discontinued 您正在浏览的产品已停产,但您仍可以继续访问此页面以获取相关售后服务支持。
successor
此产品已升级成为新型号。 继续浏览

XGT-7200

X-ray Analytical Microscope

The XGT-7200 represents a completely new generation of XRF microscope, and leads the way to a new era of science. It offers a seamless merger between optical observation and elemental analysis functions, revolutionizing the world of micro-analysis and establishing micro-XRF as a routine tool for the research and analytical scientist.

Unique hardware features ensure the system offers versatility and flexibility for every measurement. A choice of two software controlled x-ray guide tubes with diameters ranging from a unique 10 µm through to 1.2 mm allow conditions to be optimised for a range of measurements, including both micro and macro. Similarly, with the unique Dual Vacuum Modes it is possible to switch within seconds between a high sensitivity full vacuum mode and a versatile localised vacuum mode. The latter maintains samples at atmospheric pressure whilst retaining sensitivity to all elements from sodium to uranium.

In any configuration the intelligent combination of optical cameras ensure that the precise analysis position can be quickly and simply located.

事业部: 科学仪器
制造商: HORIBA, Ltd.

Integrated Software for Data Acquisition and Analysis Sample Handling

Quickly proceed from a view of the entire sample to the selection of the analysis potision.

Intuitive "click and move" images from low magnification and high magnification cameras within the sample chamber, allow the analysis position or mapping area to be defined withing seconds.

 

Acquisition Functions

Single Point and Multi-point Analysis

Single point and automated multi-point analyses allow high quality spectra to be acquired from either a single position, or from a number of user defined points across the sample. Element peaks are automatically located and labelled, and quantitative analysis down to ppm levels can be carried out using the fundamental parameters method (FPM), FPM with single standard, and full standard sample calibration.Thickness calculations can also be made on nm and µm thick multi-layered structures.

  • Single Point
  • Grid Analysis
  • Line Analysis
  • Multi-Point Analysis
    • User Selected
    • Coordinate File
  • Import with Positional Referencing [option]
  • Hyperspectral Mapped Imaging

 

Mapping Analysis

Hyperspectral Mapping Analysis

The SmartMap imaging software records a full EDXRF spectrum at each and every pixel of the element image, enabling post-acquisition element image generation and comparison, and spectrum generation from user defined regions in the image with subsequent qualitative and quantitative characterisation.

Transmitted X-ray imaging provides additional insight into a sample’s structure, allowing features invisible by eye to become immediately apparent.

  • Element image display
    Element images to be displayed can be selected during and after acquisition. Images can aslo be generated from user defined spectral windows.

  • RGB Composite Image Generation 
    Overlay elemental images to allow easy comparison of element distribution

  • Spectrum Generation
    Generate the average spectrum from a user defined region within an image.

  • Line Analysis
    Display multiple element intensity profiles across a defined region of an image.

  • Data Export
    Element images can be exported in data or image formats. The entire hyperspectral datacube can be exported in RAW format.

 

Spectrum Analysis

  • Peak auto-ID
  • Quantitative modes
    • FPM
    • FPM + Single Standard
    • Calibration
  • Spectrum overlay and compare
  • Multi-layer thickness
  • Spectrum matching

The unique features of the XGT-7200 have seen this innovative micro-XRF analyser widely embraced for a range of applications, including electronics, engine wear analysis, forensic science, geology, mineralogy, pharmaceutics, museums, metallurgy, biology, medicine and archaeology.

The flexible XGT-7200 micro-XRF system covers everything from macro analysis, for a general survey of a wide area, to the inspection of a specific micro area, with simultaneous XRF and transmission imaging. Its many features ensure high performance analysis with easy operation.

  • Highest spatial resolution

    The unique x-ray guide tube technology of HORIBA provides the highest spatial resolution micro-XRF analysis, with x-ray beam diameters down to 10 µm. The high intensity, ultra-narrow beams provided by the guide tubes allow fast, non-destructive analysis of microscopic features.
     
  • Transmission X-ray Mapped Imaging

    In combination with XRF imaging, the XGT-7200 allows transmitted X-ray images to be acquired. This can be used to perform internal structural analyses and identify regions of interest not visible to the eye. Scanning is done with a narrow perpendicular beam, resulting in clear penetrating images even for non-flat samples such as cylindrical parts.
     
  • Dual Vacuum Modes

    The XGT-7200 system offers the user unique Dual Vacuum Modes for sample analysis – switching between the two modes takes just a few seconds. In Full Vacuum Mode the entire sample chamber is subjected to vacuum conditions to ensure the ultimate sensitivity to light elements. In Partial Vacuum Mode the sample is maintained at atmospheric pressure whilst a vacuum is drawn around the detector and capillary optics. This mode is ideally suited for analysis of water containing samples such as biological tissue, and fragile archaeological/museum objects.
     
  • Complete range of sample sizes

    The accommodating sample chamber enables a wide range of samples to be analyzed, from a 10 µm spot analysis on a microscopic feature, to mapped analysis of areas as large as 10cm x 10cm.
     
  • Integrated Data Acquisition and Analysis Software

    Intuitive software allows easy control of instrument hardware, fast sample visualization and selection of measurement region, and full data analysis. Functions include automated peak identification, quantitative measurements, RGB composite image generation, line profile analysis.

XGT-7200 Specification

Elements: Na to U

X-ray tube: Rh target  / Tube voltage 50kV  / Tube current 1mA

Fluorescent X-ray detector: Peltier cooled Silicon Drift Detector (SDD)

Transmitted X-ray detector: Nai(Tl) scintilltor

X-ray guide tube: Mono capillary  10μm / 100μm with no filter

Optical image: Full sample optical image and coaxial magnification image

Sample stage size: XY : 100mm×100mm

Sample chamber: Vacuum chamber model/ Max 300mm×300mm×80mm in vacuum

Signal processing: Digital pulse processor ( INCA unit )

Qualitative analysis: Auto identification /  KLM marker /  Peak search / Compare spectrum

Quantitative analysis: Non standard FPM / Standard FPM / Standard file matching FPM /Calibration curve /   Multi layer FPM (Thickness gage) /Multi point analysis (Max5000) /  Multi point result send to Excel / XGT-5000 spectrum view

Mapping function: Transmitted X-ray image / Elemental image / Spectrum mapping /  Rectangle mapping / Generate spectrum / RGB composition / Scale maker / Line analysis

Other function: Possible to start the XGT-5200 software simultaneously.

Schematics

电气设备中的电池评估
电气设备中的电池评估
润滑油中磨损金属及添加剂元素分析
润滑油中磨损金属及添加剂元素分析
金属碎片和颗粒的显微XRF分析
金属碎片和颗粒的显微XRF分析
微观金属颗粒的快速分析是工程领域的重要应用(例如发动机磨损分析)。特定碎片的显微XRF扫描和点分析可以获得它们的化学成分。
显微XRF用于博物馆和考古样品的无损分析
显微XRF用于博物馆和考古样品的无损分析
对古代尼泊尔手稿中使用的颜料进行了分析,并对古代玻璃墓葬装饰品进行了探测,以确定使用的特定着色添加剂。
显微XRF的生物学应用
显微XRF的生物学应用
研究锌对胃溃疡愈合的影响,组织样本的元素成像显示了锌在溃疡组织内积累的证据。在一项单独的研究中,对鱼的耳石(“耳骨”)进行了分析,以揭示其异质的元素组成和物理结构。
使用 EDXRF 对叶子进行微量元素分析
使用 EDXRF 对叶子进行微量元素分析
XRF成像提供了叶片中钙根瘤浓度与叶龄之间的相关性。在另一项单独的研究中,研究了植物对重元素污染物的吸收,快速获取高分辨率图像以显示铅在叶子中的分布
使用微区XRF对稻谷进行元素分析
使用微区XRF对稻谷进行元素分析
通过使用微区XRF对稻谷进行元素分析检查谷物抛光的效果,发现矿物元素的浓度与抛光程度有关。
电子行业的显微XRF 分析
电子行业的显微XRF 分析
XGT-9000 突破性的空间分辨率和灵敏度的结合让它成为电子元件快速分析的首选仪器,可以帮助进行有害元素分析(WEEE/RoHS“无铅”立法)、故障排除还有研发
使用micro-XRF进行电子行业的质量控制和缺陷分析
使用micro-XRF进行电子行业的质量控制和缺陷分析
本应用展示了对嵌在不透明树脂中的组件故障排除和缺陷分析,包括单个组件和完整的电路板,此外ppm级别的定量分析还可以确定是否符合WEEE/RoHS 指令。
使用 Micro-XRF 快速测量薄金属涂层的厚度
使用 Micro-XRF 快速测量薄金属涂层的厚度
EDXRF的穿透性可以测试多层样品,凭借高空间分辨率可以测试电路板上的焊盘等微观结构的成分和层厚。
铅污染的玩具micro-XRF 分析
铅污染的玩具micro-XRF 分析
塑料玩具的组件中是否存在铅?通过分析表明,这种有害元素的浓度可高达 0.3%,显微X射线荧光光谱成像可以快速表征Pb在玩具中的分布。
使用micro-XRF进行指纹成像
使用micro-XRF进行指纹成像
在传统方法难以解决的情况下,高空间分辨率元素成像证明是一种有用的指纹分析方法。光面纸和精细织物上的指纹经过化学处理,随后可以进行成像。
法医学中珍珠的特征微区X射线荧光分析
法医学中珍珠的特征微区X射线荧光分析
荧光X射线和透射X射线同步成像可以得到珍珠的成分和结构信息,此类信息对海关官员至关重要,他们可以快速确定珍珠是天然珍珠、养殖珍珠还是仿制品。
使用微区X 射线荧光光谱进行枪击残留分析
使用微区X 射线荧光光谱进行枪击残留分析
枪击残留物的显微XRF分析可以对单个微观粒子的元素组成进行表征,此外提供高空间分辨率元素分布图,准确分析颗粒形状和尺寸。

留言咨询

如您有任何疑问,请在此留下详细需求信息,我们将竭诚为您服务。 * 这些字段为必填项。

Related products

Auto SE - 自动化薄膜测量工具
More Auto SE - 自动化薄膜测量工具

一键式全自动快速椭偏仪

EMGA-Expert
More EMGA-Expert

氧/氮/氢分析仪

EMGA-Pro
More EMGA-Pro

氧/氮/氢分析仪

EMIA-Pro
More EMIA-Pro

碳硫分析仪

EMIA-Step
More EMIA-Step

碳/硫分析仪

MESA-50
More MESA-50

X 射线荧光分析仪

MESA-50K
More MESA-50K

X射线荧光分析仪

SLFA-60
More SLFA-60

X射线荧光油中硫分析仪

Ultima Expert
More Ultima Expert

高分辨率,高灵敏度和高稳定性的电感耦合等离子体发射光谱仪

Ultima Expert LT
More Ultima Expert LT

高性价比的电感耦合等离子体发射光谱仪

XGT-9000
More XGT-9000

微区X射线荧光分析仪

AP-370 系列
More AP-370 系列

空气污染监测仪

APDA-371
More APDA-371

空气颗粒物监测仪

APDA-372
More APDA-372

空气颗粒物监测仪

AQMS
More AQMS

空气质量监测系统

Auto SE - 自动化薄膜测量工具
More Auto SE - 自动化薄膜测量工具

一键式全自动快速椭偏仪

Auto SE附件
More Auto SE附件

定制化专属设备

Auto Soft
More Auto Soft

Auto-Soft用户导向的分析界面-用于Auto SE和Smart SE

DataOverlay
More DataOverlay

化学和显微白光图像混合显示

DeltaPsi2软件
More DeltaPsi2软件

功能齐全的椭圆偏振光谱软件

DLC
More DLC

自动 DLC 涂层分析

EasyImage
More EasyImage

优化的分析流程

GD-OES 软件
More GD-OES 软件

Quantum 和Image

GD-OES 附件
More GD-OES 附件

适用于各种形状、尺寸和特性的样品附件

GD-Profiler 2™辉光放电光谱仪
More GD-Profiler 2™辉光放电光谱仪

用辉光放电光谱仪去发现一个崭新的信息世界

ICP Neo
More ICP Neo

ICP Software

ICP-OES
More ICP-OES

Complete your ICP-OES Spectrometer for your specific needs

Image Enhancement
More Image Enhancement

增强拉曼和光学图像

KnowItAll
More KnowItAll

拉曼光谱搜索

LabRAM Odyssey Nano
More LabRAM Odyssey Nano

纳米拉曼光谱仪

LabRAM Soleil Nano
More LabRAM Soleil Nano

纳米拉曼光谱仪

LabSpec 6: Validated performance
More LabSpec 6: Validated performance

LabSpec 6是经过验证的软件

LEM Series
More LEM Series

基于实时激光干涉测量的摄像头终点监测

MESA-50
More MESA-50

X 射线荧光分析仪

MESA-50K
More MESA-50K

X射线荧光分析仪

Methods
More Methods

调用设置,采集过程自动化

MEXA-2000SPCS series
More MEXA-2000SPCS series

固体颗粒计数系统

MultiPoints
More MultiPoints

多位置自动获取拉曼光谱

MVAPlus
More MVAPlus

适用于所有拉曼成像的多变量分析应用程序

OBS-ONE PM unit
More OBS-ONE PM unit

车载排放测量系统

OneClick
More OneClick

快速简单的拉曼采集

OpenPleX
More OpenPleX

高通量、开放式表面等离子体成像仪

Particle Finder
More Particle Finder

测试、识别和分类粒子

PP-TOFMS软件
More PP-TOFMS软件

符合人体工程学的软件,兼具数据采集,数据处理和技术支持

PX-375
More PX-375

带 X 射线荧光的连续颗粒物监测仪

Script and ActiveX
More Script and ActiveX

使用VBS进行定制化

Si Stress
More Si Stress

自动硅应力分析

SmartSampling
More SmartSampling

将拉曼成像从几小时变成几分钟

Ultima Expert
More Ultima Expert

高分辨率,高灵敏度和高稳定性的电感耦合等离子体发射光谱仪

Ultima Expert LT
More Ultima Expert LT

高性价比的电感耦合等离子体发射光谱仪

UVISEL 2 VUV
More UVISEL 2 VUV

真空紫外椭偏仪

UVISEL Plus In-Situ
More UVISEL Plus In-Situ

在线监控椭偏仪

XGT-9000
More XGT-9000

微区X射线荧光分析仪

XGT-9000SL
More XGT-9000SL

微区X射线荧光分析仪超大样品仓型

XploRA Nano
More XploRA Nano

纳米拉曼光谱仪

XploRA™ PLUS
More XploRA™ PLUS

拉曼光谱-共焦拉曼光谱仪

多变量分析
More 多变量分析

复杂数据集的数据分析

用户权限
More 用户权限

密码保护的用户访问控制

等离子体分析飞行时间质谱仪PP-TOFMS
More 等离子体分析飞行时间质谱仪PP-TOFMS

快速、灵敏、高分辨的深度剖析技术

MESA-50
More MESA-50

X 射线荧光分析仪

MESA-50K
More MESA-50K

X射线荧光分析仪

MESA-7220V2
More MESA-7220V2

X射线荧光油中硫/氯分析仪

PX-375
More PX-375

带 X 射线荧光的连续颗粒物监测仪

SLFA-60
More SLFA-60

X射线荧光油中硫分析仪

SLFA-6000
More SLFA-6000

X射线荧光油中硫分析仪

XGT-9000
More XGT-9000

微区X射线荧光分析仪

XGT-9000SL
More XGT-9000SL

微区X射线荧光分析仪超大样品仓型