Over than 70% of recent papers published with GD data refer to HORIBA Jobin Yvon instruments and several key patents give us a world leading position in the field. In this article we will illustrate the latest developments in GD Spectrometries through a survey of recently published articles. Pulsed RF Glow Discharge OES and Plasma Profiling TOFMS provide rapid depth profile composition of thin and thick layers of conductive and non-conductive layers with excellent depth resolution, sensitivity and multi-element capability. Thus, they contribute to the development of new advanced materials and, being fast and easy to operate, they are changing the way people consider surface analysis.